Awaji S., Teranishi R., Inoue M., Sato Y., Matsumoto A., Kaneko K., Hiramatsu K., Miyajima T., Yasuyama S.
Ключевые слова: HTS, GdBCO, coated conductors, joints superconducting , fabrication, buffer layers, GdBCO, resistance, X-ray diffraction, microstructure, pressure dependence, experimental results
Ключевые слова: HTS, YBCO, thin films, fabrication, substrate single crystal, buffer layers, PLD process, defects columnar, ion irradiation, irradiation effects, pinning, critical caracteristics, anisotropy, Jc/B curves, X-ray diffraction, microstructure, critical current density, angular dependence, n-value, experimental results
Ключевые слова: coated conductors, fabrication, substrate Ni-W, buffer layers, texture, chemical solution deposition
Ключевые слова: pnictides, coated conductors, substrate metallic, pinning, fabrication, PLD process, buffer layers, pinning force, IBAD process, resistive transition, magnetic field dependence, activation energies, critical caracteristics, Jc/B curves, critical current density, angular dependence, experimental results
Ключевые слова: HTS, coated conductors, texture, buffer layers, ISD process, fabrication, microstructure, X-ray diffraction
Ключевые слова: YBCO, PrBCO, X-ray diffraction, precursors, solid-state synthesis, bulk, PLD process, multilayered structures, films epitaxial, buffer layers, nanoscaled effects, substrate LaAlO3, substrate single crystal, resistive transition, resistivity, temperature dependence, thickness dependence, fabrication, experimental results
Ключевые слова: HTS, YBCO, bulk, fabrication, texture, seeding technique, buffer layers, levitation performance, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, chemical solution deposition, buffer layers, gradient, X-ray diffraction, temperature dependence, fabrication, microstructure, critical caracteristics, Jc/B curves, pinning force, resistive transition, resistivity, experimental results
Ключевые слова: HTS, YBCO, substrate Hastelloy, CVD process, laser application, double-side structures, buffer layers, X-ray diffraction, texture, microstructure, fabrication
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Ключевые слова: HTS, coated conductors, fabrication, substrate Hastelloy, buffer layers, planarization, MOD process, roughness, YBCO, PLD process, laminations
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